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XRLINE, a program to evaluate the crystallite size of supported metal catalysts by single X-ray profile Fourier analysis
datasetposted on 06.12.2019 by Nicolae Aldea, Emil Indrea
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Abstract The computer program presented is based on the Fourier analysis of a single X-ray diffraction profile. An X-ray diffraction method is presented which is capable of determining the average particle size, microstrain, stacking fault probability as well as the particle size distribution function in crystalline materials. The main numerical methods used are: 1. (i) smoothing and interpolation by 3rd-order piecewice polynomial functions or by c... Title of program: XRLINE Catalogue Id: ABLL_v1_0 Nature of problem The analysis of the broadening of the diffraction line in the X-Ray powder pattern is a valuable technique for the investigations of structure and properties of crystalline materials. ... CORRECTION SUMMARY: Vol:Year:Page 64:1991:343 "000A CORRECTION 19/12/90" "XRLINE: a program to evaluate the crystallite size of supported metal catalysts by single x-ray profile Fourier analysis. (C.P.C. 60(1990)155)." N. Aldea; E. Indrea Note: correction instructions are contained in source code Versions of this program held in the CPC repository in Mendeley Data ABLL_v1_0; XRLINE; 10.1016/0010-4655(90)90084-E This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2019)